- Title
- Mapping chemical concentration in binary thin organic films via multi-wavelength scanning absorption microscopy (MWSAM)
- Creator
- Berriman, Garth; Routley, Ben; Holdsworth, John; Zhou, Xiaojing; Belcher, Warwick; Dastoor, Paul
- Relation
- Measurement Science and Technology Vol. 25, Issue 9
- Publisher Link
- http://dx.doi.org/10.1088/0957-0233/25/9/095901
- Publisher
- IOP Publishing
- Resource Type
- journal article
- Date
- 2014
- Description
- The composition and thickness of binary thin organic films is determined by measuring the optical absorption at multiple wavelengths across the film surface and performing a component analysis fit to absorption standards for the materials. The multiple laser wavelengths are focused onto the surface using microscope objectives and raster scanned across the film surface using a piezo-electric actuator X–Y stage. All of the wavelengths are scanned simultaneously with a frequency division multiplexing system used to separate the individual wavelength response. The composition values are in good quantitative agreement with measurements obtained by scanning transmission x-ray microscopy (STXM). This new characterization technique extends quantitative compositional mapping of thin films to thickness regimes beyond that accessible by STXM.
- Subject
- organic solar cells; thin film analysis; composition mapping; optical absorption spectroscopy
- Identifier
- http://hdl.handle.net/1959.13/1061738
- Identifier
- uon:17003
- Identifier
- ISSN:0957-0233
- Language
- eng
- Full Text
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